首页> 外文会议>International symposium on photoelectronic detection and imaging >Thermal Annealing Effects on The Properties of Intersubband Absorption in CdS/ZnSe and (CdS/ZnSe)/BeTe Ⅱ-Ⅵ Quantum Wells
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Thermal Annealing Effects on The Properties of Intersubband Absorption in CdS/ZnSe and (CdS/ZnSe)/BeTe Ⅱ-Ⅵ Quantum Wells

机译:热退火对CdS / ZnSe和(CdS / ZnSe)/ BeTeⅡ-Ⅵ量子阱中子带间吸收特性的影响

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The authors report the study of thermal annealing (TA) effects on the intersubband transitions (ISB-T) properties in (CdS/ZnSe)/BeTe and CdS/ZnSe multiple quantum wells (MQWs). The samples were grown on (OOl)-GaAs substrates by molecular beam epitaxy. With the increase of annealing temperature, the ISB-T shifts to longer wavelength in (CdS/ZnSe)/BeTe MQWs, but to short wavelength in CdS/ZnSe MQWs. The ISB absorption vanishes at the annealing temperature of 270 °C for CdS/ZnSe QWs while survives to up to 440 °C for (CdS/ZnSe)/BeTe QWs. For (CdS/ZnSe)/BeTe MQWs after 20 minutes of TA, absorption wavelength and intensity become stable. For CdS/ZnSe MQWs, however we observed a blue shift in wavelength accompanied by a decrease of intensity after 45 minutes of TA. Photo-induced ISB-T measurements indicate that the disappearance of ISB absorption results from the loss of free-carriers in the well layers, ω/2θ scan and two-dimensional reciprocal space mapping (2DRSM)) measurements of X-ray diffraction (XRD) indicate that a built-up of tensile strain and interdiffusion at interfacial region in the annealed (CdS/ZnSe)/BeTe heterostructrues. 2DRSM also shows the enhanced structural relaxation in CdS/ZnSe MQWs. Based on the XRD analysis, the effects of TA on the ISB-T in (CdS/ZnSe)/BeTe and CdS/ZnSe MQWs are explained.
机译:作者报告了热退火(TA)对(CdS / ZnSe)/ BeTe和CdS / ZnSe多量子阱(MQW)中子带间跃迁(ISB-T)性质的影响的研究。样品通过分子束外延生长在(001)-GaAs衬底上。随着退火温度的升高,ISB-T在(CdS / ZnSe)/ BeTe MQWs中移至更长的波长,而在CdS / ZnSe MQWs中移至短波长。对于CdS / ZnSe QW,ISB吸收在270°C的退火温度下消失,而对于(CdS / ZnSe)/ BeTe QW,其ISB吸收高达440°C。对于经过20分钟的TA的(CdS / ZnSe)/ BeTe MQW,吸收波长和强度变得稳定。然而,对于CdS / ZnSe MQW,在TA 45分钟后观察到了波长的蓝移并伴随着强度的降低。光诱导的ISB-T测量表明,ISB吸收的消失是由于阱层中自由载流子的损失,ω/2θ扫描和X射线衍射(XRD)的二维互易空间映射(2DRSM)测量导致的)表示在退火(CdS / ZnSe)/ BeTe异质结构的界面区域中会产生拉伸应变和相互扩散。 2DRSM还显示了CdS / ZnSe MQWs中增强的结构弛豫。基于X射线衍射分析,解释了TA对(CdS / ZnSe)/ BeTe和CdS / ZnSe MQWs中ISB-T的影响。

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