首页> 外文会议>International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors >A Piecewise Approximation for Short-Channel 'Extrinsic' MOSFET Drain Current Dependence on Drain-to-Source Bias Including Linear Triode, Linear Saturation and Asymptotic Saturation Regimes
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A Piecewise Approximation for Short-Channel 'Extrinsic' MOSFET Drain Current Dependence on Drain-to-Source Bias Including Linear Triode, Linear Saturation and Asymptotic Saturation Regimes

机译:短通道“外在”MOSFET漏极电流依赖性对漏极 - 源极偏差的分段近似,包括线性三极管,线性饱和度和渐近饱和度

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Previously, we transformed the linear drain bias asymptote equation for the MOSFET drain current in the saturation regime from the "intrinsic" case into "extrinsic" case with accounting for the velocity saturation effect. We obtained the equation for the drain current that yielded the nonlinear dependence on the "extrinsic" drain bias in saturation regime in an implicit form. We derived the equation for the differential conductance of the MOSFET at the "saturation point" and proposed a linear approximation for the dependence of the drain current on the "extrinsic" drain bias in the saturation regime for not very high drain bias when nonlinear effects can be neglected. In this paper, we investigate the asymptotic behavior of the implicit equation for the drain current in case when "extrinsic" drain bias tends to infinity. We propose the nonlinear approximation for the drain current asymptotic that describes a slow current rise to its limiting value when the "extrinsic" drain bias tends to infinity. This approximation is based on analytical solution of quartic equation that can be solved easily enough using Ferrari's method.
机译:此前,我们将MOSFET漏极电流的线性漏极偏置渐近电流从“内在”壳体中的“内在”壳体中的“外在”壳体转换为“外在”案例,算用于速度饱和效应。我们获得了漏极电流的等式,其产生非线性依赖性对隐式形式的饱和状态下的“外在”漏极偏压。我们在“饱和点”处的MOSFET的差分电导等方程式,提出了在非线性效应可以的饱和状态下的“外在”漏极偏压上的漏极电流对漏极电流的依赖性的线性近似被忽视了。在本文中,我们研究了在“外在”漏极偏向倾向于无穷大的情况下的漏极电流隐式方程的渐近行为。当“外在”漏极偏压趋于无穷大时,我们提出了对漏极电流渐近的非线性近似,所述漏极电流渐近的漏极电流渐近的慢性电流升高到其限制值。该近似基于间隔的分析解,可以使用法拉利的方法容易地解决。

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