"Going One Step Beyond" sometimes involves bringing the past back into the present, to allow the Failure Analysis community to continue their contribution to present and future technologies. Circuit Level probing is testing, measuring or characterizing the operation of an electronic circuit. It has been around as long as there have been circuits. It is Circuit Level probing which reveals the true operation of a circuit, and takes the next step beyond electrical engineering design and circuit simulation. This paper presents the return of Circuit Level probing in nanoelectronics by means of SEM based nanoprobing.
展开▼
