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DEFECTS CHARACTERIZATION IN Cu(In,Ga)Se_2 THIN FILMS SOLAR CELLS BY BIASED PHOTOLUMINESCENCE

机译:偏光致发光法表征Cu(In,Ga)Se_2薄膜太阳能电池的缺陷表征

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The dependence of photoluminescence of CIGS solar cells under applied voltage is investigated forsamples with two different buffer layers, CdS and ZnS. Photoluminescence under bias is a derivative method which issensitive to the electric field induced changes in the PL response. According to the theory based on simple transportequation, with increasing forward bias the PL intensity increases, reaches a maximum and keeps constant or decreasesagain. The PL maximum is reached in flat band condition, i.e. when the applied voltage is around the built-in voltage Vbi;.However, experimental results show dependence of Vbi with the buffer layer. Indeed, with ZnS buffer layer flat bandcondition is reached at 0.6–1 V while CdS samples seem to exhibit higher values. In this study, a model is developed tostudy the real influence of the buffer layer on photoluminescence. Simulation results show that the buffer/absorberinterface properties such as the interface states and band offsets are crucial for the determination of the built-in voltage.
机译:研究了CIGS太阳能电池在外加电压下的光致发光依赖性。 具有两个不同缓冲层(CdS和ZnS)的样品。偏压下的光致发光是一种导数方法,它是 对电场敏感的PL响应引起的变化。根据简单运输理论 方程,随着正向偏压的增加,PL强度增加,达到最大值并保持恒定或减小 再次。在平坦频带条件下,即当所施加的电压在内置电压Vbi附近时,达到PL最大值。 但是,实验结果表明Vbi与缓冲层的相关性。确实,采用ZnS缓冲层的平坦带 当CdS样品显示出更高的值时,在0.6–1 V时达到了条件。在这项研究中,模型被开发为 研究缓冲层对光致发光的真正影响。仿真结果表明,缓冲/吸收剂 诸如接口状态和带偏移之类的接口属性对于确定内置电压至关重要。

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