首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >OPTIMIZING THE DEPOSITION OF THIN LAYERS OF ORGANIC-INORGANIC HYBRID PEROVSKITE METHYLAMMONIUM LEAD IODIDE (CH3NH3PBI3) ON LARGE SURFACES THROUGH THEIR OPTICAL PROPERTIES
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OPTIMIZING THE DEPOSITION OF THIN LAYERS OF ORGANIC-INORGANIC HYBRID PEROVSKITE METHYLAMMONIUM LEAD IODIDE (CH3NH3PBI3) ON LARGE SURFACES THROUGH THEIR OPTICAL PROPERTIES

机译:通过光学性质优化大型表面上的有机 - 无机杂交钙钛矿甲基铅(CH3NH3PB1)的薄层沉积

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Nowadays, most of the Research and Development (R&D) efforts devoted to perovskite solar cells have been focused on achieving higher power conversion efficiencies, by using small sized substrates with even smaller active areas. The present paper proposes a method for optimizing the deposition of thin layers of organic-inorganic hybrid perovskite methylammonium lead iodide (CH_3NH_3PbI_3) on large surfaces (up to 75 mm × 75 mm) via spin coating procedures, performed in a clean room environment at room temperature and by considering their optical properties to assess their quality. Thus, in order to map the deposited area and realize studies about their optical properties, the absorption coefficient, the refractive index and layers thicknesses were determined by using a high accuracy spectroscopic ellipsometer system based on rotating compensator ellipsometer (RCE) technology from the J.A. Woolam Co. as functions of the wavelength, within a spectral range from 250 to 800 nm. Also, the samples were studied with a fluorescence spectroscopic system, in order to evaluate their photoluminescence properties and, in order to validate the chosen methodology; an Atomic Force Microscopy was used to verify the layers uniformity and thicknesses.
机译:如今,大多数研究和开发(研发)致力于佩洛夫斯基特太阳能电池的努力一直专注于实现更高的功率转换效率,通过使用甚至更小的活性区域的小尺寸基材。本文提出了一种通过旋涂装置在大型表面(高达75mm×75mm)上优化薄层有机 - 无机杂交钙钛矿甲基铅(CH_3NH_3PBI_3)的薄层的方法,在室内洁净室环境中进行温度和考虑其光学性质评估其质量。因此,为了映射沉积的区域并实现关于它们的光学性质的研究,通过使用基于J.A的旋转补偿器椭圆仪(RCE)技术的高精度光谱椭圆仪系统来确定吸收系数,折射率和层厚度。 Woolam Co.作为波长的功能,在光谱范围内,从250到800nm。此外,用荧光光谱系统研究样品,以评估它们的光致发光性能,以验证所选的方法;原子力显微镜检查用于验证层均匀性和厚度。

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