METHOD AND DEVICE FOR ELECTRICALLY CONTACTING SI-CELLS AS A BASIS FOR CLASSIFICATION MEASUREMENT COMBINED WITH SAFE MATERIAL HANDLING

摘要

Si-wafer based PV modules consist of many single solar cells. The best match of these cells within the module guarantees the maximum output, because the worst cell is essential for the overall behaviour of the module. Exact and repeatable classification of the solar cells is the basis for the availability of the maximum power that has been produced until the cells reach the roof. While being tested, the cells reach their maximum value in the cell production chain. Therefore, the biggest waste of value is cell loss caused by damage in this step. The purpose of the work is to improve the critical final test process of the cell and possibly other electrical test steps during cell production. Very precise and permanently improved contacting technologies have been available in semiconductor manufacturing for years. The approach of this work was to transfer contact technologies out of semiconductor testing into the Si-cell testing. This paper presents an approach to provide electrical test conditions characterized by reproducing real application conditions and current distribution along the busbar on a cell with constant contact resistance over a long period of time in the production process, with a long life time of the contacts used in cell test and by minimal contact forces during cell test.