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Evaluation for Micro Surface Topography Based on Multi-fractal Spectrum

机译:基于多重分形谱的微表面形貌评价

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摘要

Aiming at the deficiency of traditional method in evaluating micro surface topography, an evaluation method is advanced based on multi-fractal spectrum. In this method, the probability measure of the gray image of micro surface topography is counted in the improved box-counting method, and the multi-fractal spectrums are extracted by the Legendre transformation of scale exponent. Based on the multi-fractal spectrum, the spectrum width, height interval and asymmetry degree are extracted, and micro surface topography are evaluated according to the parameters. Evaluation experiments of surface topographies are carried out to prove the value of multi-fractal spectrums, and the result shows that multi-fractal spectrum can overcome the deficiency of traditional method, and surface topography can be evaluated accurately by its parameters.
机译:针对传统方法在微观表面形貌评价中的不足,提出了一种基于多重分形谱的评价方法。该方法采用改进的盒数法对微观表面形貌的灰度图像进行概率测度,并通过比例指数的勒让德变换提取多形谱。基于多重分形光谱,提取光谱宽度,高度间隔和不对称度,并根据参数评估微表面形貌。进行了表面形貌评价实验,证明了多重分形谱的价值,结果表明,多重分形谱可以克服传统方法的不足,可以通过其参数准确地评价表面形貌。

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