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Combinatorial study of thin-film Cu2ZnSnS4 synthesis via metal precursor sulfurization

机译:金属前体硫化合成薄膜Cu 2 ZnSnS 4 的组合研究

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We report on studies related to the synthesis of thin-film Cu2ZnSnS4 via sulfurization of metal-precursor thin films. Combinatorially graded thin-film Cu-Zn-Sn library samples spanning various regions of the ternary Cu-Zn-Sn phase diagram were deposited at temperatures below 375 K and subsequently sulfurized in a high-vacuum system equipped with a sulfur valved-cracking source at temperatures from 600 K to 675 K. Comparisons of x-ray fluorescence and x-ray diffraction data from pre- and post-sulfurization films have revealed correlations between processing conditions, film composition, and the crystalline phases present. We have also performed cathodoluminescence and photoluminescence measurements and identified emission features consistent with the formation of the Cu2ZnSnS4.
机译:我们报道了有关通过金属前体薄膜硫化合成薄膜Cu 2 ZnSnS 4 的研究。跨越三元Cu-Zn-Sn相图各个区域的组合梯度薄膜Cu-Zn-Sn库样品在低于375 K的温度下沉积,随后在配备有硫阀裂化源的高真空系统中硫化温度从600 K到675K。硫化前后薄膜的X射线荧光和X射线衍射数据的比较表明,加工条件,薄膜组成和存在的结晶相之间存在相关性。我们还进行了阴极发光和光致发光测量,并确定了与Cu 2 ZnSnS 4 的形成一致的发射特征。

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