New method for dielectric properties characterization of powder materials: Application to silicon carbide

摘要

This article presents an original method of materials characterization. Our method is used for broad-band (30MHz–6GHz) determination of the complex dielectric permittivity of powder materials. This technique is based on the measurement of S parameters of two microstrip lines partially loaded with micrometric powder of silicon carbide (SiC). The results exhibit a good agreement with the very few other published values found in the literature. This method is investigated in the frame work of the study and realization of composite materials for microwave sintering operations.