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Effects of crosstalk on photoresponse for mid-wavelength InSb infrared focal plane arrays

机译:串扰对中波长InSb红外焦平面阵列光响应的影响

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Effects of the electrical crosstalk on photoresponse for mid-wavelength InSb infrared focal plane arrays have been numerically studied under back-side illumination. In designing the 2D device model, for geometrical variables the mesa depth and the thickness of substrate are the key points, and for physical models the Poisson equation and continuity equations are taken into account. Our work shows that the crosstalk increases monotonously with the increase of mesa depth and the thickness of substrate. And the optimal values can be found to optimize the device structure.
机译:电串扰对中波长InSb红外焦平面阵列光响应的影响已在背面照明下进行了数值研究。在设计2D设备模型时,对于几何变量,台面深度和基板厚度是关键点,而对于物理模型,则考虑了Poisson方程和连续性方程。我们的工作表明,串扰随着台面深度和衬底厚度的增加而单调增加。可以找到最佳值来优化器件结构。

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