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Novel nonuniformity correction method for 128×128 MOS resistor array infrared projector

机译:128×128 MOS电阻阵列红外投影仪的非均匀性校正新方法

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Nonuniformity correction technique for MOS resistor array is always the key problem and advanced technology in the research and development of infrared scene generator. Based on a lot of tests on 128×128 MOS resistor array, the cause of the nonlinearity and nonuniformity is deeply analyzed, and a novel nonuniformity correction algorithm for MOS resistor array is presented. Firstly the entire projection array is covered with a sparse grid and a linear look-up table is established. Then a compensation table is created by collecting the corrected data. The above procedure is iterated to refine the compensation table gradually. The final experimental results show that the nonuniformity correction method may improve the infrared image uniformity remarkably and preferably satisfy the infrared imaging simulation requirement.
机译:MOS电阻阵列的不均匀校正技术一直是红外场景发生器研发中的关键问题和先进技术。在对128×128 MOS电阻阵列进行大量测试的基础上,深入分析了非线性和不均匀性的原因,提出了一种新的MOS电阻阵列不均匀性校正算法。首先,整个投影阵列被稀疏网格覆盖,并建立了线性查找表。然后,通过收集校正后的数据来创建补偿表。重复上述过程以逐渐完善补偿表。最终的实验结果表明,该不均匀性校正方法可以显着提高红外图像的均匀性,并较好地满足红外成像仿真的要求。

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