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A femtosecond electron diffraction system

机译:飞秒电子衍射系统

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摘要

The femtosecond electron diffraction (FED) is a unique method for the study of the changes of complex molecular structures, and has been specifically applied in the investigations of transient-optics, opto-physics, crystallography, and other fields. The FED system designed by the present group, consists of a 35nm Ag photocathode evaporated on an ultraviolet glass, an anode with a 0.1mm aperture, two pairs of deflection plate for the deflection of electron beams in X and Y directions, and the Y deflection plate can be used as a scanning plate while measuring the pulse width of electron beams, the double MCPs detector for the enhancing and detecting of electron image. The magnetic lens was used for the focusing of the electron beams, and the focal length is 125mm. The distance between the object(the photocathode) and the image(the sample) is 503mm, and the size of electron beams is smaller than 17microns after focusing, the convergence angle is of -0.075~0.075°, and the temporal resolution is better than 350fs.
机译:Femtosecond电子衍射(FED)是研究复杂分子结构变化的独特方法,并专门用于调查瞬态光学,光学物理学,晶体学和其他领域。由本组设计的馈电系统由紫外线玻璃上蒸发的35nm Ag光电阴极,具有0.1mm孔的阳极,两对偏转板,用于X和Y方向上的电子束的偏转,以及Y偏转板可以用作扫描板,同时测量电子束的脉冲宽度,双MCPS检测器用于增强和检测电子图像。磁透镜用于电子束的聚焦,焦距为125mm。物体(光电阴极)与图像(样品)之间的距离为503mm,并且电子束的尺寸小于17micron,聚焦后,收敛角为-0.075〜0.075°,时间分辨率优于350FS。

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