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EFFECT OF PREPARATION CONDITIONS ON THE OPTOELECTRICAL AND STRUCTURAL PROPERTIES OF CuInS_2 THIN FILMS GROWN BY A TWO-STEP PROCESS

机译:制备条件对两步法生长CuInS_2薄膜的光电和结构性能的影响

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CuInS_2 thin films were prepared on soda-lime glass substrates by a two-step process using elemental sulfur evaporated froman effusion cell and metallic precursors evaporated from tungsten boats. The films were characterized by spectraltransmittance, conductivity, thermoelectric power and x-ray diffraction (XRD) measurements to investigate the effect of thegrowth temperature on the optical constants (refractive index n, absorption coefficient a and optical gap E_g), crystallographicphase and electrical transport properties.The optical constants and the crystallographic parameters of the CuInS_2 films were calculated using transmittance, XRDmeasurements and computational tools to simulate the transmittance and XRD spectra, respectively. The results showed thepresence of secondary In_2Se_3 and Cu_2S phases in some CuInS_2 films. However, it was possible to grow films containing onlythe CuInSe_2 phase by selecting adequately the preparation parameters. Furthermore, it was also found that the substratetemperature significantly affects the optical and electrical properties.
机译:使用两步法,从钠钙玻璃衬底上制备CuInS_2薄膜,方法是从 从钨舟中蒸发出的渗出池和金属前驱物。膜的特征在于光谱 透射率,电导率,热电功率和X射线衍射(XRD)测量,以研究激光的影响 生长温度对光学常数(折射率n,吸收系数a和光学间隙E_g)的影响,晶体学 相和电传输性质。 CuInS_2薄膜的光学常数和晶体学参数使用透射率,X射线衍射来计算 测量和计算工具,分别模拟透射率和XRD光谱。结果显示 一些CuInS_2薄膜中存在次生In_2Se_3和Cu_2S相。但是,可以种植仅包含 通过选择适当的制备参数的CuInSe_2相。此外,还发现基材 温度会显着影响光学和电气性能。

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