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CONTROL OF OXYGEN CONTENT WITH OXYGEN GAS INTRODUCTION IN Cr(N,O) THIN FILMS PREPARED BY PULSED LASER DEPOSITION

机译:用脉冲激光沉积制备的Cr(n,o)薄膜中的氧气引入氧气含量

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Hard coatings, such as CrN, are used in cutting tools. By partial replacement of the N in CrN with O, Cr(N,O) thin films with a Bl (NaCl type) structure can be produced. Furthermore, the hardness of these thin films can be increased by increasing the oxygen content. In our previous work, thin films were prepared by depositing Cr vapor in N_2 or NH_3 ambient gas with residual oxygen, but controlling the oxygen content precisely was difficult. In this work, O_2 gas was introduced with precise control of oxygen content in Cr(N,O) thin films prepared by pulsed laser deposition. After the chamber was evacuated to a pressure of 2.5×10~(-5) Pa, O_2 gas was introduced and nitrogen plasma from a RF radical source was applied. They were then characterized by X-ray diffraction, infrared spectroscopy and electron energy loss spectroscopy. It was found that the oxygen content of the thin films changed from 0 to 62 mol % with increasing oxygen partial pressure (P_(O2)- The thin films with only the Bl-Cr(N,O) phase were prepared under P_(O2)< 7.5×10~(-5) Pa. The oxygen content of the Cr(N,O) thin films was successfully controlled by P_(O2).
机译:硬涂层,如CRN,用于切割工具。通过用O的CRN中的n替换N,可以制造具有BL(NaCl型)结构的Cr(N,O)薄膜。此外,通过增加氧含量可以增加这些薄膜的硬度。在我们以前的工作中,通过用残留的氧气沉积N_2或NH_3环境气体中CR蒸气来制备薄膜,但难以沉积氧气含量。在这项工作中,通过脉冲激光沉积制备的Cr(n,o)薄膜中的氧含量精确控制O_2气体。在将腔室抽空至2.5×10〜(-5)PA的压力之后,涂覆O_2气体并施加来自RF自由基源的氮等离子体。然后,它们的特征在于X射线衍射,红外光谱和电子能损光谱。发现薄膜的氧含量随着氧分压的增加而改变为0至62摩尔%(P_(O2) - 在P_(O2)下制备具有BL-Cr(N,O)相的薄膜(O2 )<7.5×10〜(-5)pa。Cr(n,o)薄膜的氧含量由p_(o2)成功控制。

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