This paper addresses the modeling, simulation and measurement of the self-resonant frequency of capacitor chip components using a low cost test fixture and a vector network analyzer. The test fixture and the components to be measured are modeled using Agilent's ADS software. Comparisons between the modeling and simulation and the experimental results are presented. The process allows the extraction of parasitic elements associated with the text fixture, the prediction of test fixture resonant frequencies and provides information for improved test fixture design.
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