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Multi-embedding and path approximation of metric spaces

机译:度量空间的多嵌入和路径逼近

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Metric embeddings have become a frequent tool in the design of algorithms. The applicability is often dependent on how high the embedding's distortion is. For example embedding into ultrametrics (or arbitrary trees) requires linear distortion. Using probabilistic metric embeddings, the bound reduces to O(log nlog logn). Yet, the lower bound is still logarithmic.We make a step further in the direction of bypassing this difficulty. We define "multi-embeddings" of metric spaces where a point is mapped onto a set of points, while keeping the target metric being of polynomial size and preserving the distortion of paths. The distortion obtained with such multi-embeddings into ultrametrics is at most O(log Δ log log Δ) where Δ is the (normalized) diameter, and probabilistically O(log n log log log n). In particular, for expander graphs, we are able to obtain constant distortions embeddings into trees vs. the Ω(logn) lowerbound for all previous notions of embeddings.We demonstrate the algorithmic application of the new embeddings by obtaining improvements for two well-known problems: group Steiner tree and metrical task systems.
机译:度量嵌入已成为算法设计中的常用工具。适用性通常取决于嵌入的失真程度。例如,嵌入到超度量标准(或任意树)中需要线性失真。使用概率度量嵌入,边界减小为 O (log n log log n )。但是,下限仍然是对数的。我们朝着绕过这一困难的方向迈出了一步。我们定义度量空间的“多嵌入”,将一个点映射到一组点上,同时将目标度量保持为多项式大小并保留路径的失真。用这种多嵌入法获得的失真最多为 O (logΔlog logΔ),其中Δ为(规格化)直径,概率为 O (log < I> n 日志日志 n )。特别是对于扩展图,我们能够获得恒定失真嵌入到树中,而先前所有嵌入概念的Ω(log n )下限都是如此。新嵌入的算法应用,方法是对两个众所周知的问题进行改进:组Steiner树和度量任务系统

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