首页> 外文会议>2002 Place conference >DETERMINATION OF CAUSES OF COEFFICIENT OF FRICTION INCREASES IN PE/PET LAMINATES USING TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY
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DETERMINATION OF CAUSES OF COEFFICIENT OF FRICTION INCREASES IN PE/PET LAMINATES USING TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY

机译:飞行时间二次离子质谱法测定PE / PET层压板摩擦系数增加的原因

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The Coefficient of Friction (COF) of PE/PET laminates is critical to their performance in packaging applications. Occasionally, the COF of these films can unexpectedly increase when they are stored. The COF of the film is controlled primarily by the SLIP additives that have been deliberately blended into the film. In order to fully understand why a given film has an acceptable or unacceptable COF, one must identify the total SLIP content of the film, the location of the SLIP within the film, and the type of SLIP present in the film. Furthermore, since other components of the film may interfere with the SLIP, it is often necessary to fully characterize the film to identify the factors that alter the behavior of the SLIP. Several techniques are available for SLIP analysis, including extraction (coupled with FTIR, GC, HPLC and/or NMR), and Attenuated Total Internal Reflectance FTIR (ATR). However, these techniques are often insufficient to generate a complete picture in order to solve a COF problem. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) can be used to identify and quantify the SLIP present, map the distribution of the SLIP, and map the construction of the complete film. In this manner, this technique can be used to identify the root cause of the COF problem. In this case, the ToF-SIMS identified the root cause as mixing of the urethane adhesive used in the lamination into the PET layer. The mixed urethane/PET layer interacts with the SLIP at the surface to redistribute the SLIP into the mixed layer, reducing the COF of the film.
机译:PE / PET层压板的摩擦系数(COF)对于其在包装应用中的性能至关重要。有时,这些胶片在存储时会意外地增加其COF。薄膜的COF主要由故意掺入薄膜中的SLIP添加剂控制。为了完全理解为什么给定胶片具有可接受的COF或不可接受的COF,必须确定胶片的总SLIP含量,胶片内SLIP的位置以及胶片中存在的SLIP的类型。此外,由于薄膜的其他成分可能会干扰SLIP,因此通常需要对薄膜进行全面表征,以识别影响SLIP行为的因素。 SLIP分析可采用多种技术,包括提取(与FTIR,GC,HPLC和/或NMR结合使用)和衰减全反射FTIR(ATR)。但是,这些技术通常不足以生成完整的图片以解决COF问题。飞行时间二次离子质谱(ToF-SIMS)可用于识别和量化存在的SLIP,绘制SLIP的分布图以及绘制整个胶片的结构。以这种方式,该技术可用于识别COF问题的根本原因。在这种情况下,ToF-SIMS确定了根本原因是将层压中使用的聚氨酯粘合剂混入了PET层中。混合的聚氨酯/ PET层在表面与SLIP相互作用,以将SLIP重新分布到混合层中,从而降低了薄膜的COF。

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