Best Ways to Use Billions of Devices on a Chip - Error Predictive, Defect Tolerant and Error Recovery Designs

摘要

Error rates on an LSI are increasing according to the Moore's law. Now is the time to start incorporating error-tolerant design methodologies. This paper introduces sources of failures in semiconductor devices, levels of dependability according to applications of devices and some circuit-level techniques to detect or recover faults after shipping.