FAULT-TOLERANT ERROR CORRECTION DECODING METHOD AND DEVICE OF QUANTUM CIRCUIT, AND CHIP

摘要

The present application relates to the technical filed of artificial intelligence and quanta. Disclosed are a fault-tolerant error correction decoding method and device of a quantum circuit, and a chip. The method comprises: acquiring real error symptom information of a quantum circuit, the real error symptom information being information obtained by performing noisy error symptom measurement on the quantum circuit by using a quantum error correction code; decoding the real error symptom information to obtain a logic error class and perfect error symptom information corresponding to the real error symptom information; and determining error result information of the quantum circuit according to the logic error class and the perfect error symptom information, the error result information being used for indicating a data quantum bit with an error in the quantum circuit and a corresponding error type. According to the present application, fault-tolerant error correction decoding is equivalent to a classification problem, so that an efficient neural network classifier is suitable for performing fault-tolerant error correction decoding on the error symptom information, thus increasing the fault-tolerant error correction decoding speed and enabling the implementation of real-time fault-tolerant error correction decoding.