Fault-tolerant and error-correcting decoding method and apparatus for quantum circuit, and chip

摘要

This application discloses a fault-tolerant and error-correcting decoding method and apparatus, and chip for a quantum circuit, and relates to the field of artificial intelligence (AI) and quantum technologies. The method includes the steps of: obtaining actual error syndrome information of a quantum circuit—the actual error syndrome information performs noise error syndrome measurements on the quantum circuit using a quantum error correction (QEC) code Information obtained by doing decoding the real error syndrome information to obtain perfect error syndrome information and logical error class corresponding to the real error syndrome information; determining error result information of the quantum circuit based on the logic error class and perfect error syndrome information—the error result information is used to indicate data qubits and corresponding error classes in which errors occur in the quantum circuit - includes The present application equivalently converts the fault tolerance and error correction decoding into a classification problem, so that fault tolerance and error correction decoding can be performed on error syndrome information using an efficient neural network classifier, whereby fault tolerance and error correction decoding can be performed Improve the error correction decoding speed, and achieve real-time fault tolerance and error correction decoding.