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Module selection using manufacturing information

机译:模块选择使用制造信息

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Since manufacturing processes inherently fluctuate, LSI chips which are produced from the same design have different propagation delays. However, the difference in delays caused by the process fluctuation has rarely been considered in most high-level synthesis systems which were developed before. This paper presents a new approach to module selection in high-level synthesis, which exploits difference in functional unit delays. First, a module library model which assumes the probabilistic nature of functional unit delays is presented. Then, we propose a module selection problem and an algorithm which minimizes the cost per faultless chip. Experimental results demonstrate that the proposed algorithm finds the optimal module selection which would not have been explored without manufacturing information.
机译:由于制造工艺本质上,由相同设计产生的LSI芯片具有不同的传播延迟。然而,在以前开发的大多数高级合成系统中,流程波动引起的延迟差异很少。本文介绍了高级合成中模块选择的新方法,利用功能单元延迟的差异。首先,提出了假定功能单元延迟的概率性质的模块库模型。然后,我们提出了模块选择问题和一种算法,最小化每个故障芯片的成本。实验结果表明,该算法发现最佳模块选择,而不在没有制造信息的情况下探索。

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