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Thin-film photodetectors for the ultraviolet and vacuum-ultraviolet spectral range

机译:用于紫外线和真空紫外光谱范围的薄膜光电探测器

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In this paper we report about thin film photodetectors optimized for the detection of the vacuum ultraviolet. The devieces are based on hydrogenated amorphous silicon and silicon carbide p-i-n heterostructures on glass substrate. At room temperature the photodetectors exhibit values of quantum efficiency of 52 percent at #lambda#=58.4 nm, 1percent at #lambda#=400 nm, and 0.1percent at #lambda#=650 nm. The time response at ultraviolet pulses from an N_2 laser gives signals with 6 #mu#s full width half maximum and 500 ns rise time. Stability of the device is presently affected by light activation of boron dopant occurs in the p-layer under U V illumination and ihas been investigated by a simple equivalent circuit of the structure. The effect can be minimized by optimization on the electrode geomery. The devices are suitable for integration in low-cost, large-area arrays.
机译:在本文中,我们报告了为检测真空紫外线而优化的薄膜光电探测器。该装置基于玻璃基板上的氢化非晶硅和碳化硅p-i-n异质结构。在室温下,光电探测器在#lambda#= 58.4 nm处显示52%的量子效率值,在#lambda#= 400 nm处显示1%的量子效率,在#lambda#= 650 nm处显示0.1%的量子效率。 N_2激光器发出的紫外线脉冲的时间响应给出了全宽半峰为6#μ#s和上升时间为500 ns的信号。目前,器件的稳定性受到在U V照射下在p层中发生的硼掺杂剂光激活的影响,并且已经通过该结构的简单等效电路进行了研究。可以通过优化电极几何来最小化该影响。该器件适合集成在低成本,大面积阵列中。

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