Near-Field Scanning Microwave Microscopy of Superconducting Materials and Devices

摘要

Superconducting microwave devices are now beginning to show significant potential for cellular telephone applications. The key limitations to this new technology, besides reliable inexpensive cryogenic cooling, are the problems of power dependence and nonlinearity. We have employed imaging techniques, including scanning near-field microwave microscopy of devices and materials, to begin examining the microscopic origins of nonlinearity.