Characterization of surface and subsurface defects in optical materials using near-field evanescent wave (Abstract Only)

摘要

Abstract: Optical properties of sub-micron defects is of interest in many application, including laser induced damage in optical materials. In-situ scanning atomic force microscopy has been used previously to establish a direct correlation between a particular structure surface inhomogeneity and the initiation of local laser damage at that inhomogeneity, as in the case of nodular defects in coatings. Recent development in near field scanning optical microscopy shows that this technique can also provide information on both morphology and optical properties of localized defects. !0