DEVICE FOR SEARCHING AND CHARACTERIZATION OF SURFACE DEFECTS IN OPTICAL MATERIALS

摘要

FIELD: defectoscopy.;SUBSTANCE: invention relates to scientific and technical developments in the field of techniques and devices, which enable to determine defects in optical materials, and enables to isolate surface defects. Device comprises a piezoelectric microresonator located at the end of the glass capillary, and at least two metal electrodes made in the form of rods located inside the capillary, into which the optical fiber is inserted. Device can contain from 2 to 6 metal electrodes, which allows selecting optimum direction of field intensity for excitation of piezoelectric resonance. Piezoelectric microresonator can have various shape, including shape of hemisphere or truncated pyramid.;EFFECT: invention makes it possible to carry out local measurements, enables to work not only with crystals, but also with glass, and can be used as nondestructive method of controlling optical materials.;3 cl, 5 dwg