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Evaluating the Mechanical Reliability of Reballed Bga Modules

机译:评估植球Bga模块的机械可靠性

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The need for Ball Grid Array (BGA) rework may arise from a variety of reasons: placement or other assembly-related errors, design errors, or rescuing of a perfectly functioning BGA module from an otherwise defective board. Because BGA devices typically represent high value components compared to other components on the assembly, the rework need is significant. Previous, significant literature discusses the salvaging of a printed circuit board for BGA replacement - wherein a BGA module is typically discarded and, after site preparation, the board receives a new BGA component. The focus of this paper is on the reballing process step of BGA rework or, in other words, the salvaging of the BGA module. Specifically, this paepr serves to evalaute the mechanical reliability of reballed BGA modules. The modules chosen for rework and analysis in this paper are Ceramic BGAs (CBGAs). The CBGAs used in this effort are full array, 255-I/O CBGAs (16x16 with one corner ball position intentionally vacant - for orientation designation0 with 1.27 mm center-to-center distances. The reliability is measured by ball shear-force testing. Here, the components are tested prior to assembly.
机译:球栅阵列(BGA)返工的原因可能有多种,其中包括:放置或其他与组装相关的错误,设计错误,或从其他可能有缺陷的电路板上拯救功能正常的BGA模块。由于BGA器件通常代表比组装件上的其他组件高价值的组件,因此返工需求非常重要。先前,大量文献讨论了用于BGA更换的印刷电路板的补救方法-其中通常会丢弃BGA模块,并且在现场准备后,电路板会收到新的BGA组件。本文的重点是BGA返工的换球工艺步骤,或者换句话说,是挽救BGA模块。具体而言,此paepr用于评估重新植球的BGA模块的机械可靠性。本文选择用于返工和分析的模块是陶瓷BGA(CBGA)。此工作中使用的CBGA是全阵列255-I / O CBGA(16x16,其中一个角球位置故意腾空-定向指定0的中心距为1.27 mm,可靠性是通过球剪切力测试来衡量的。此处,在组装之前先对组件进行测试。

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