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MODEL FOR THE DENSITY OF SURFACE STATES AND THE SCHOTTKY BARRIER HEIGHT IN SNO_2 AND TIO_2 THICK FILM GAS SENSORS

机译:SnO_2和TiO_2厚膜气体传感器中表面状态密度和肖特基势垒高度的模型

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A theoretical model has been developed to interpret the different behavior of SnO_2 and TiO_2 sensors. It is based on the determination of the surface-state density, which pins the Fermi level of the semiconductor, thus removing the linear relationship between the work function and the grain-to-grain energy barrier. To interpret these differences, measurements of the built-in potential, V_(bi), related to the Schottky barrier, were pursued at different temperatures in thick-films of SnO_2 and TiO_2, obtained via sol-gel. The model predicts a decrease in the density of surface states with the grain radius only in TiO_2, which seems to be confirmed by the experiment.
机译:已经开发了一种理论模型来解释SnO_2和TiO_2传感器的不同行为。它基于表面状态密度的测定,其引脚销的FERMI水平的半导体,从而消除功函数与谷粒对电能屏障之间的线性关系。为了解释这些差异,在通过溶胶 - 凝胶获得的SnO_2和TiO_2的厚膜的不同温度下,在SnO_2和TiO_2的厚膜的不同温度下测量与肖特基屏障相关的内置电位V_(BI)的测量。该模型预测仅在TiO_2中具有晶粒半径的表面状态密度的降低,这似乎通过实验确认。

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