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Optical probes as tools for the investigation of aging properties of high-power laser diode arrays

机译:光学探针作为研究大功率激光二极管阵列老化特性的工具

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Abstract: Optical probes are used for the investigation of aging properties of high-power laser diode arrays. Two methods - micro-Raman and laser beam induced current (LBIC) scans are discussed: Micro-Raman spectroscopy - a laboratory based method - was applied in order to investigate facet temperature distributions for fresh and aged high-power laser diode arrays (LDA) under regular operation conditions. Furthermore, facet temperatures were measured for operation close to the catastrophic optical damage (COD) level.For these experimental situation facet temperatures of more than 600 degrees C were obtained. In order to conclude from pure temperature data to the thermal management of the LDA we performed modeling work based on the finite element method. Close to the COD up to 14 percent of the total thermal load of the LDA is concentrated to a very thin region close to the facet. Photocurrent spectra and LBIC were found to indicate aging induced effects such as defect creation as well as strain effects. LBIC - method which also could be used as test method for fabrication processes - allows to map aging induced changes of defect distributions in LDAs. Furthermore, the potential of LBIC as quick strain inspection method is discussed. !24
机译:摘要:光学探针用于研究大功率激光二极管阵列的老化性能。讨论了两种方法-显微拉曼和激光束感应电流(LBIC)扫描:显微拉曼光谱法-一种基于实验室的方法-应用于研究新鲜和老化的大功率激光二极管阵列(LDA)的刻面温度分布在常规操作条件下。此外,在接近灾难性光学损伤(COD)水平的情况下测量了小平面温度,针对这些实验情况,获得了超过600摄氏度的小平面温度。为了从纯温度数据到LDA的热管理得出结论,我们基于有限元方法进行了建模工作。接近COD的地方,高达LDA总热负荷的14%集中在靠近刻面的非常薄的区域。发现光电流光谱和LBIC表明老化引起的影响,例如缺陷的产生和应变的影响。 LBIC-也可以用作制造过程的测试方法-允许绘制LDA中老化引起的缺陷分布变化的图。此外,还讨论了LBIC作为快速应变检查方法的潜力。 !24

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