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Application of multivariate statistical analysis to EDX investigations of interfacial composition using FEG-STEM

机译:多元统计分析在使用FEG-STEM进行EDX界面成分研究中的应用

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The use of multivariate statistics is described as a precursor to processing of EDX spectra. Spectra are factorised into independent, orthogonal sources of information. The physical origin of each source is identified, and those components corresponding to noise and artefacts excluded. The method is illustrated using segregation profiles across interfaces in steels acquired using a FEG-STEM. to improve sensitivity, and to remove coherent bremsstrahlung, artefacts and noise.
机译:多元统计的使用被描述为处理EDX光谱的先驱。频谱被分解为独立的正交信息源。确定每个来源的物理来源,并排除与噪声和伪像相对应的那些成分。该方法通过使用FEG-STEM采集的钢中界面之间的偏析轮廓进行了说明。以提高灵敏度,并消除连贯的致辐射,伪影和噪声。

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