首页> 外文期刊>Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada >A standards-based method for compositional analysis by energy dispersive x-ray spectrometry using multivariate statistical analysis: Application to multicomponent alloys
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A standards-based method for compositional analysis by energy dispersive x-ray spectrometry using multivariate statistical analysis: Application to multicomponent alloys

机译:使用多元统计分析的基于能量色散X射线光谱法的成分分析的基于标准的方法:在多组分合金中的应用

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摘要

Given an unknown multicomponent alloy, and a set of standard compounds or alloys of known composition, can one improve upon popular standards-based methods for energy dispersive X-ray (EDX) spectrometry to quantify the elemental composition of the unknown specimen? A method is presented here for determining elemental composition of alloys using transmission electron microscopy-based EDX with appropriate standards. The method begins with a discrete set of related reference standards of known composition, applies multivariate statistical analysis to those spectra, and evaluates the compositions with a linear matrix algebra method to relate the spectra to elemental composition. By using associated standards, only limited assumptions about the physical origins of the EDX spectra are needed. Spectral absorption corrections can be performed by providing an estimate of the foil thickness of one or more reference standards. The technique was applied to III-V multicomponent alloy thin films: composition and foil thickness were determined for various III-V alloys. The results were then validated by comparing with X-ray diffraction and photoluminescence analysis, demonstrating accuracy of approximately 1% in atomic fraction
机译:给定一种未知的多组分合金,以及一组已知成分的标准化合物或合金,是否可以改进基于流行的基于标准的能量色散X射线(EDX)光谱分析方法来量化未知样品的元素组成?在此介绍一种使用透射电子显微镜的EDX和适当标准物确定合金元素组成的方法。该方法从一组已知成分的相关参考标准离散集合开始,对那些光谱进行多元统计分析,然后使用线性矩阵代数方法评估成分,以将光谱与元素成分相关联。通过使用相关标准,只需要关于EDX光谱的物理起源的有限假设即可。可以通过提供一种或多种参考标准品的箔厚度估算值来执行光谱吸收校正。该技术已应用于III-V多元合金薄膜:确定了各种III-V合金的成分和箔厚度。然后通过与X射线衍射和光致发光分析进行比较来验证结果,证明原子分数的准确性约为1%

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