首页> 外文会议>Institute of Physics Electron Microscopy and Analysis Group conference >Towards scanned neutral particle microscopy: Developing neutral particle analogues of charged particle lenses.
【24h】

Towards scanned neutral particle microscopy: Developing neutral particle analogues of charged particle lenses.

机译:朝向扫描中性颗粒显微镜:发育带电粒子透镜的中性粒子类似物。

获取原文

摘要

Scanning microscopes employing neutral particle probes can offer advantages over charged-particle microscopes for some measurements and may also enable entirely new spectroscopic tools. The required focusing neutral-particle optics are however far less developed than the electron optics of scanning electron microscopes (SEM). Here we present calculations for a proposed neutral-particle "magnetostatic aperture lens" as an example of how it is possible to quite generally adapt the cylindrically symmetric charged-particle optics such as those used in SEM, to neutral particles including neutrons and neutral atoms and molecules for use in possible scanned neutral-particle microscopes.
机译:采用中性粒子探针的扫描显微镜可以提供与一些测量的带电粒子显微镜的优点,并且还可以实现全新的光谱工具。然而,所需的聚焦中性粒子光学器件比扫描电子显微镜(SEM)的电子光学显影得多。在这里,我们提出了所提出的中性粒子“磁膜透镜”的计算作为如何完全通常适应圆柱形对称的带电粒子光学器件,例如SEM中使用的圆柱形对称的带电粒子光学器件,以包括中性和中性原子的中性颗粒用于可能的扫描中性粒子显微镜的分子。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号