Factors Affecting the Accuracy of Structure Factor Measurements in TiAl

摘要

This paper discusses the effects of uncertainties in the determination of Debye-Waller (D-W) factors and actual sample composition on the accuracy of experimentally refined structure factors of TiAl. The influence of D-W factors is assessed by converting free atom coefficients of crystal potential, V_g, to x-ray structure factors, F_g. The effects of sublattice ordering and uncertainty in composition are assessed using the F_(200) as a test case for TiAl.