Scanning Reflection Electron Microscopy study of a cleaved diamond surface

摘要

To contribute to research on wear and friction of diamonds, the possibility of exploiting the STEM, with electrons following a glancing angle reflection ray path, was investigated. A cleaved {111} diamond surface, was imaged, employing dynamic focussing. Using a strong reflection as found in the diffraction pattern obtained under parallel illumination, Reflection Electron Energy Loss Spectra (REELS) were recorded. Features due to energy losses in diamond, but also due to losses in graphite, were observed. The surface of a friction track and debris, as produced by scratching the surface with a diamond stylus, were also imaged and investigated by REELS.