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The role of plasmon scattering in the quantitative contrast analysis of high-resolution lattice images of GaAs

机译:等离子体散射在高分辨率晶格图像的定量对比分析中的作用

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We compare unfiltered, energy filtered zero loss and plasmon loss high-resolution lattice images from a cleaved GaAs wedge specimen. The filtered zero loss images exhibit lower lattice fringe amplitudes than the unfiltered images which can be explained only by the contributions of the plasmon images (whether coherently or incoherently) to the contrast being in phase with the filtered zero loss image contrast. The contrast maxima of the (200) lattice fringes occur at the same specimen thicknesses in the plasmon and zero-loss images, suggesting that the elastic and the plasmon scattering are coherently related at least for thicknesses up to 30nm.
机译:我们比较未过滤的能量过滤零损失和等离子体损失从切割的GaAs楔形样品的高分辨率晶格图像。过滤的零损耗图像表现出低于未过滤的图像的较低的晶格边缘幅度,这可以仅通过等离子体图像的贡献来解释(无论是否相干或间歇地)与滤波的零损耗图像对比度相位相位。 (200)晶格条纹的对比度最大值在等离子体和零损蚀图像中以相同的标本厚度发生,表明弹性和等离子体散射至少应与高达30nm的厚度相干相关。

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