Use of high pressure scanning electron microscopy (HPSEM) in histology

摘要

In conventional SEM both secondary electron detection and specimen current detection cannot be used satisfactorily for non conducting specimens, without a conducting coating, due to charging problems. A recently developed 'bias specimen current detector' can be used in high pressure scanning electron microscopy (HPSEM) for satisfactory - charge free - viewing of non conducting specimens. The principles of charge buildup elimination are described and the application of HPSEM for examining routinely prepared stained and unstained histological specimens is discussed.