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The study of optical properties of Zn1-xMNxSe thin films grown by MOCVD on GaAs substrates

机译:GaAs衬底上MOCVD法生长Zn 1-x MN x Se薄膜的光学性能研究

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A series of Zn1-xMnxSe thin film samples with different Mn compositions were grown by metal-organic chemical vapor deposition. X-ray diffraction measurements indicated the good crystallinity of samples. Two emission peaks were observed in photoluminescence (PL) spectra close to the band edge for the samples. The temperature dependence of PL shows the change of the relative intensity of the two emission peaks, which is attributed to the competition between band-to-band excitonic transitions and transitions of localized excitons bound to Mn-induced impurity bound states. Time-resolved PL measurements and PL under different excitation power also support this analysis. Further investigation implies that the impurity bound states are associated with Mn incorporation.
机译:通过金属有机化学气相沉积法制备了一系列具有不同Mn组成的Zn 1-x Mn x Se薄膜样品。 X射线衍射测量表明样品具有良好的结晶度。在靠近样品的带边缘的光致发光(PL)光谱中观察到两个发射峰。 PL的温度依赖性显示了两个发射峰的相对强度的变化,这归因于谱带间激子跃迁与结合到Mn诱导的杂质键合态的局部激子跃迁之间的竞争。时间分辨的PL测量和不同激励功率下的PL也支持此分析。进一步的研究表明,杂质结合态与Mn的结合有关。

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