Automated reflectometer for surface plasmon resonance studies in the infrared and its application for the characterization of Pd Films

摘要

This work reports the development of an automated rellectometer for surface plasmon resonance (SPR) studies in the infrared. The system is computer controlled, operates in the angle scan measurement scheme, and motion control is driven by a tracking algorithm that allows maintaining the laser footprint stationary on the sample during angle scan measurements. The system can be employed in applications that include the characterization of optical surfaces and thin films and for real time monitoring of processes involving chemical or biological surface reactions for the development of optical sensors. As a result of an ongoing investigation directed to the development of hydrogen sensors based on the SPR effect on palladium, use of the rellectometer for the optical characterization of thin films of this material is reported.