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Design of On-Chip Debug Module Based on MCU

机译:基于MCU的片上调试模块设计

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摘要

A design method of embedded OCD (On-Chip Debugging) based on Intel 8051 MCU architecture is proposed. The OCD module named E-OCD-SFR_B (Enhanced OCD module with SFR(Special Function Register) Breakpoint Function) is integrated into an existing MCU core, implementing several debugging function. The method we proposed is able to switch from running mode and debugging mode conveniently by controlling the debugging enable port and also enables controlling the MCU core in debugging mode by additional SFR. The function of SFR breakpoint is added, so we could trace the particular SFR, this is the reinforcement to the exiting OCD methods. The principles of E-OCD-SFR_B and detailed implemental method and simulation solution based on EDA platform are presented and validated. The simulation result indicates the completely observing and controlling to the core is achieved without any effect to original functions of the system.
机译:提出了一种基于Intel 8051 MCU架构的嵌入式OCD(On-Chip Debugging)设计方法。名为E-OCD-SFR_B的OCD模块(具有SFR(特殊功能寄存器)断点功能的增强型OCD模块)已集成到现有的MCU内核中,实现了多种调试功能。通过控制调试使能端口,我们提出的方法不仅可以方便地从运行模式切换到调试模式,还可以通过附加SFR在调试模式下控制MCU内核。添加了SFR断点的功能,因此我们可以跟踪特定的SFR,这是对现有OCD方法的增强。提出并验证了E-OCD-SFR_B的原理以及基于EDA平台的详细实现方法和仿真解决方案。仿真结果表明,对核心的完全观察和控制对系统的原始功能没有任何影响。

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