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DRAM APPARATUS AND METHOD OF DEBUGGING POST SILICON USING ON-CHIP DRAM FOR MULTI-CORE DESIGN

机译:用于多核设计的使用片上DRAM的后置硅器件的DRAM装置和方法

摘要

The present invention relates to a technology for selectively debugging only data estimated as an error during post silicon debugging in a multi-core environment using an on-chip DRAM. According to an embodiment of the present invention, a post silicon debugging method comprises the steps of: verifying error sections of a dubbing section by generating golden data corresponding to the debugging section based on a simulation before debugging, and uploading the generated golden data on a trace buffer; detecting an error cycle corresponding to the verified error sections; and selectively debugging error data corresponding to the detected error cycle.
机译:本发明涉及一种用于使用片上DRAM选择性地仅调试在后硅调试期间估计为错误的数据的技术。根据本发明的实施例,后硅调试方法包括以下步骤:通过在调试之前基于模拟生成与调试部分相对应的黄金数据,来验证配音部分的错误部分,并将所生成的黄金数据上载到光盘上。跟踪缓冲区;检测与验证的错误部分相对应的错误周期;选择性地调试与检测到的错误周期对应的错误数据。

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