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Reconstructing permittivity profiles using an improved renormalization technique

机译:使用改进的归一化技术重建介电常数分布

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A new approach for reconstructing the permittivity profile of a half space medium illuminated by TEM, TE or TM polarized waves is presented. It depends on an improved renormalization technique in conjunction with a revised version of the non-linear Riccati differential equation describing the direct problem. The method represents fundamental bases for 3D-generalization, which is essential for microwave imaging used, e,g., in biomedical applications. A known permittivity profile has been taken to generate reflection coefficient data. These data have been used in conjunction with the proposed technique to reconstruct the permittivity profile. Deviation of a maximum of 2% between original and reconstructed profiles could be easily achieved.
机译:提出了一种重构由TEM,TE或TM极化波照射的半空间介质的介电常数分布的新方法。它取决于改进的重归一化技术以及描述直接问题的非线性Riccati微分方程的修订版。该方法代表了3D泛化的基本基础,这对于例如生物医学应用中使用的微波成像必不可少。已经采用已知的介电常数分布来产生反射系数数据。这些数据已与提出的技术结合使用,以重建介电常数分布。原始轮廓和重建轮廓之间的最大偏差为2%,可以轻松实现。

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