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Highly textured ZnO thin films and SnO/sub 2//ZnO bilayer films prepared by the pyrosol process

机译:通过热溶胶法制备的高织构化ZnO薄膜和SnO / sub 2 // ZnO双层薄膜

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Indium-doped ZnO(ZnO:In) films have been prepared on heated Corning 7059 glass by pyrosol spray method. Indium improves the conductivity as an n-type dopant and stimulates grain growth. For films grown at 400/spl deg/C, resistivity of ZnO films decreased from 1.3/spl times/10/sup -2/ /spl Omega/ cm to 3.5/spl times/10/sup -3/ /spl Omega/ cm by doping 1 wt% indium. Furthermore, ZnO:In films grown at higher temperture revealed larger grain sizes and a higher texturization compared to undoped films. A highly textured ZnO:In films with resistivity of 2.5/spl times/10/sup -3/ /spl Omega/ cm, total transmittance of 80% was made at the substrate temperature of 475/spl deg/C, and was milky looking. ZnO:In films did not degrade under hydrogen plasma, and was applied as a protection barrier against hydrogen plasma and the light scattering layer in the SnO/sub 2//ZnO bilayer films. Bilayer films have a resistivity of 8.8/spl times/10/sup -4/ /spl Omega/ cm and total transmittance of 84% at 550 nm, and was proved to have an excellent hydrogen plasma durability.
机译:通过热溶胶喷涂法在加热的康宁7059玻璃上制备了掺铟的ZnO(ZnO:In)薄膜。铟改善了作为n型掺杂剂的导电性并刺激了晶粒的生长。对于以400 / spl deg / C生长的薄膜,ZnO薄膜的电阻率从1.3 / spl次/ 10 / sup -2 / / splΩ/ cm降低到3.5 / spl次/ 10 / sup -3 / / splΩ/ cm通过掺杂1重量%的铟。此外,与未掺杂的薄膜相比,在较高温度下生长的ZnO:In薄膜显示出更大的晶粒尺寸和更高的织构化。高度织构化的ZnO:在电阻率为2.5 / spl乘以10 / sup -3 / / splΩ/ cm的薄膜中,在475 / spl deg / C的衬底温度下总透光率为80%,看起来像乳白色。 ZnO:In膜在氢等离子体下不会降解,并被用作针对氢等离子体和SnO / sub 2 // ZnO双层膜中的光散射层的保护层。双层膜的电阻率为8.8 / spl乘以/ 10 / sup -4 / / splΩ/ cm,并且在550 nm处的总透射率为84%,并且被证明具有出色的氢等离子体耐久性。

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