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Highly textured ZnO thin films and SnO/sub 2//ZnO bilayer films prepared by the pyrosol process

机译:高度纹理ZnO薄膜和SnO / Sub 2 //通过吡咯醇方法制备的ZnO双层膜

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Indium-doped ZnO(ZnO:In) films have been prepared on heated Corning 7059 glass by pyrosol spray method. Indium improves the conductivity as an n-type dopant and stimulates grain growth. For films grown at 400/spl deg/C, resistivity of ZnO films decreased from 1.3/spl times/10/sup -2/ /spl Omega/ cm to 3.5/spl times/10/sup -3/ /spl Omega/ cm by doping 1 wt% indium. Furthermore, ZnO:In films grown at higher temperture revealed larger grain sizes and a higher texturization compared to undoped films. A highly textured ZnO:In films with resistivity of 2.5/spl times/10/sup -3/ /spl Omega/ cm, total transmittance of 80% was made at the substrate temperature of 475/spl deg/C, and was milky looking. ZnO:In films did not degrade under hydrogen plasma, and was applied as a protection barrier against hydrogen plasma and the light scattering layer in the SnO/sub 2//ZnO bilayer films. Bilayer films have a resistivity of 8.8/spl times/10/sup -4/ /spl Omega/ cm and total transmittance of 84% at 550 nm, and was proved to have an excellent hydrogen plasma durability.
机译:通过吡咯醇喷雾法在加热的咸康宁7059玻璃上制备铟掺杂的ZnO(ZnO:In)薄膜。铟改善了导电性作为n型掺杂剂并刺激晶粒生长。对于以400 / SPL DEG / C生长的薄膜,ZnO膜的电阻率从1.3 / SPL时/ 10 / SUP-2 / / SPLω/ cm至3.5 / SPL时间/ 10 / SUP -3 / / SPLω/ cm通过掺杂1wt%的铟。此外,ZnO:在更高温度生长的薄膜中,与未掺杂的薄膜相比,较高的晶粒尺寸和更高的纹理化。一种高度纹理的ZnO:在具有2.5 / SPL时/ 10 / SUP-3 / / SPLω/ cm的电阻率的薄膜中,在475 / SPL DEG / C的基板温度下进行80%的总透射率,乳白色。 ZnO:在薄膜下在氢等离子体下没有降解,并且被用作SnO / Sub 2 // ZnO双层膜中的氢等离子体和光散射层的保护屏障。双层薄膜的电阻率为8.8 / spl时/ 10 / sup -4 / / splω/ cm,并且在550nm处的总透射率为84%,并且证明具有优异的氢等离子体耐久性。

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