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Test Vehicle For The Measurement Of Charge Collection And Soft Error rate Prediction In high-density Memories due to /spl alpha/-particle strikes

机译：用于/ spl alpha /粒子撞击的高密度内存中电荷收集和软错误率预测的测试工具

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《》|2001年|P.150-153|共4页
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Oldiges; P.; Furuyama; T.;
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中图分类无线电电子学、电信技术 ;
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专利

1. Unified model for junction size, substrate doping, and energy dependence of /spl alpha/-particle-induced charge collection [J] . Hyungsoon Shin Electronics Letters . 1996 ,第20期

机译：界面尺寸，衬底掺杂和/ splα/颗粒诱导的电荷收集的能量依赖性的统一模型
2. Physics of Multiple-Node Charge Collection and Impacts on Single-Event Characterization and Soft Error Rate Prediction [J] . Black J.D., Dodd P.E., Warren K.M. IEEE Transactions on Nuclear Science . 2013 ,第3aPart2期

机译：多节点电荷收集的物理特性及其对单事件表征和软错误率预测的影响
3. Modeling alpha-particle-induced accelerated soft error rate in semiconductor memory [J] . Myeong Kook Gong, Do Woo Kim, Chang Yeol Lee, IEEE Transactions on Electron Devices . 2003 ,第7期

机译：在半导体存储器中模拟α粒子引起的加速软错误率
4. Test Vehicle For The Measurement Of Charge Collection And Soft Error rate Prediction In high-density Memories due to /spl alpha/-particle strikes [C] . Oldiges P., Furuyama T., Institute of Electric and Electronic Engineer IEEE International Conference on Microelectronic Test Structures . 2001

机译：由于/ SPLα/ -Particle罢工，在高密度存储器中测量电荷收集和软错误率预测的测试车辆
5. An analysis of alpha-particle-induced soft errors in high-density dynamic random-access memory arrays. [D] . Perry, Reginald Jon. 1989

机译：高密度动态随机存取存储器阵列中由α粒子引起的软错误的分析。
6. Cognitive tests predict real-world errors: the relationship between drug name confusion rates in laboratory-based memory and perception tests and corresponding error rates in large pharmacy chains [O] . Scott R Schroeder, Meghan M Salomon, William L Galanter, -1

机译：认知测试可预测现实世界中的错误：基于实验室的记忆和知觉测试中的药品名称混淆率与大型药房链中相应的错误率之间的关系
7. Monte Carlo Simulation of Neutrons, Protons, Ions and Alpha Particles Involved in Soft Errors in Advanced Memories [O] . Frédéric WROBEL, Frédéric SAIGNE 2011

机译：蒙特卡罗仿真中子，质子，离子和α粒子涉及高级记忆中的软误差
8. Geometric Analysis of Soft Errors and Oxide Damage Produced by Heavy Cosmic Rays and Alpha Particles [R] . Bradford, J. N. 1979

机译：重宇宙线和α粒子产生的软错误和氧化损伤的几何分析

Test Vehicle For The Measurement Of Charge Collection And Soft Error rate Prediction In high-density Memories due to /spl alpha/-particle strikes

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