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Blue-emitting ZnS:Ag,Al phosphor with low defect density for high-voltage field emission displays

机译:低缺陷密度的发蓝光的ZnS:Ag,Al磷光体,用于高压场发射显示器

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In recent years, deterioration of luminescence efficiency of blue-emitting ZnS:Ag,Al powder phosphors has been investigated for high-voltage (e.g. 6-10 kV) field emission displays (FEDs). It has been found by cross-sectional transmission electron microscopy (TEM) that the degree of crystallinity of ZnS host crystal within the electron penetration depth (e.g. 300 nm) is one of the important factors in order to obtain ZnS:Ag,Al phosphors having a longer lifetime of luminescence efficiency. Taking the evidence available into account, necessary characteristics for a suitable ZnS:Ag,Al phosphor with a lower defect density, N/sub 0/ are speculated to be the optimum amount of Ag activator and equal mole-fraction of Al coactivator, lower amounts of residual flux impurities, typically chlorine, and smaller atomic-scale surface roughness. Therefore, ZnS:Ag,Al phosphors with a lower N/sub 0/ for FED use compared with a P22B ZnS:Ag,Al(Cl) phosphor for color-TV use have been developed by using a suitable firing method and an additional annealing treatment.
机译:近年来,已经研究出用于高电压(例如6-10kV)场发射显示器(FED)的发蓝光的ZnS:Ag,Al粉末磷光体的发光效率的降低。通过横截面透射电子显微镜(TEM)发现,ZnS主体晶体在电子穿透深度(例如300nm)内的结晶度是获得ZnS:Ag,Al荧光粉的重要因素之一。发光效率的寿命更长。考虑到可用的证据,推测具有较低缺陷密度N / sub 0 /的合适ZnS:Ag,Al磷光体的必要特性被认为是最佳的Ag活化剂和相等摩尔分数的Al共活化剂,较低的量残留的助焊剂杂质(通常为氯)和较小的原子级表面粗糙度。因此,通过使用合适的烧结方法和额外的退火工艺,已开发出与用于彩电的P22B ZnS:Ag,Al(Cl)荧光粉相比,用于FED的N / sub 0 /更低的ZnS:Ag,Al荧光粉治疗。

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