light polarisation; near-field scanning optical microscopy; silicon; elemental semiconductors; aluminium; quartz; optical fabrication; micromachining; transmission electron microscopy; optical materials; light transmission; silicon compounds; optical design techniques; optical films; polarization property; metal coated scanning near-field optical microscopy probe; silicon cantilever; aluminum coated quartz tip; batch fabrication; micromachining technology; light insertion; transmission electron microscopy; polycrystalline aluminum layer; far-field measurement; light transmission; theoretical modelling; 12 micron; 60 nm; SiO/sub 2/; Si; Al;
机译:弯曲调制技术在扫描近场光学显微镜中弯曲光纤探头的极化特性和磁光成像
机译:弯曲光纤探针和磁光成像在扫描近场光学显微镜下偏振光学成像的偏振性能,极化调制技术
机译:由于无孔近场扫描光学显微镜探针中金属层的修饰而导致的偏振模式耦合
机译:完全金属涂层扫描近场光学显微镜探针的偏振特性
机译:扫描近场光学显微镜用于测量纳米级的材料性能。
机译:在任意取向的线性偏振激发下具有全螺旋的全金属涂层扫描近场光学显微镜探头和螺旋波纹
机译:偏振光纤探针与磁光成像的偏振特性扫描近场光学显微镜与偏振调制技术。
机译:粒子捕获的近场扫描光学显微镜:散射和去极化。