Nonlinear analysis of CMOS LC-tuned VCO phase noise

摘要

A second order nonlinear stochastic differential equation is used as a tool for phase noise analysis in submicron CMOS LC VCOs. The negative resistance topology typical of integrated microwave designs is considered. Expressions for the phase noise characteristics are derived in terms of circuit parameters and shown to closely match simulation results. The insight gained is used to explore circuit design trade-offs.