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Study of magnetron sputtering of vanadium oxide thin films

机译:磁控溅射氧化钒薄膜的研究

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In this paper, the influence of different sputtering processes on square resistance of thin films has been discussed; the temperature coefficient of resistance (TCR) and the square resistance R/spl square/ of thin films were tested and analyzed. The proper technology parameter is found. At last, the composition of the films was analyzed by the XPS.
机译:本文讨论了不同溅射工艺对薄膜平方电阻的影响;测试并分析了电阻温度(TCR)和薄膜的方形电阻R / SPL平方系数。找到了正确的技术参数。最后,通过XPS分析薄膜的组成。

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