This paper discusses the value of determining the fault coverage and diagnostic resolution of an at-speed functional test. State-of-the-art electronic card assemblies require testing for correct operation at their rated speed. In many cases, an at-speed functional test serves this purpose. Automated fault injection as a means of determining at-speed functional test fault coverages and diagnostics is presented based on the author's experience with the Proteus DVT-100, an automatic fault injection tool. Based on a well-known model, the relationship and trends of shipped defect levels, with respect to functional test fault coverage, are discussed. A summary of data collected from a typical board fault injection is presented.
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