Simultaneous measuring /spl epsi//sub r/ and /spl mu//sub r/ of compound materials on-site using open-ended waveguide sensor

摘要

Rectangular waveguide aperture for simultaneous measurement of constitutive parameters /spl epsi//sub r/ and /spl mu//sub r/, of materials is developed in this paper. Both multilayer and single layer medium sheet samples are tested which is sandwiched between a flange of an open-ended waveguide and a parameter which can be obtained by optimization technique by fitting the theoretical values to the reflection coefficients /spl Gamma/(/spl mu//sub r/,/spl mu//sub r/) with /spl epsi//sub r/ /spl mu//sub r/ as the arguments. The related details, such as test theories, waveguide design, sample preparation, and error analysis are also discussed in this paper. The experimental results are validated by the measurements performed on the reflection-transmission method using HP8510C ANA and the published data by companies. By virtue of its open-ended waveguide character this technique is well suited for sheet or coating materials and it might be applied for the industry on-the-worksite testing or biomedium defection.