A test cases generation method for FSM with counters and its fault coverage evaluation using a mutant generator

摘要

In this paper, we propose a test cases generation method for communication protocols modeled as finite-state machines (FSMs) with counters, which is a subclass of EFSM (extended finite-state machines). We also evaluate the fault coverage of the test suite generated by the proposed method. For evaluating the fault coverage, we suppose that the protocol specifications are implemented in C language and provide a restricted fault model in C language. We developed a mutant generator based on the fault models, and experimented with a sample protocol extracted from the OSI session protocol. An experiment shows that the test suite generated by our method detects faults of every mutant generated by the mutant generator.